The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
본 논문에서는 프로브를 스캔하여 전류 및 전압 분포를 추정하는 방법을 설명합니다. 이 방법은 전류와 프로브 사이의 결합이 프로브 방향에 따라 달라지는 현상을 이용합니다. 전류와 전압은 네 방향 각각에 대한 프로브 벡터 출력을 계산하여 추정됩니다. 따라서 단일 프로브를 사용하여 전류 및 전압 벡터 분포를 동시에 추정할 수 있습니다. 디지털 IC 패키지와 마이크로스트립 라인의 추정된 분포는 이 방법이 신뢰할 수 있는 결과를 생성한다는 것을 보여주었습니다. 프로브의 구조가 간단하므로 크기를 쉽게 줄일 수 있습니다.
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Satoshi KAZAMA, Shinichi SHINOHARA, Risaburo SATO, "Estimation of Current and Voltage Distributions by Scanning Coupling Probe" in IEICE TRANSACTIONS on Communications,
vol. E83-B, no. 3, pp. 460-466, March 2000, doi: .
Abstract: This paper describes a method for estimating current and voltage distributions by scanning with a probe. The method takes advantage of the phenomenon that the coupling between the current and the probe varies with the direction of the probe. The current and voltage are estimated by calculating the probe vector output for each of four directions. Both the current and voltage vector distributions can thus be estimated at the same time by using a single probe. The estimated distributions in a digital IC package and a microstrip line showed that this method produces reliable results. The simple structure of the probe should make it easy to reduce its size.
URL: https://global.ieice.org/en_transactions/communications/10.1587/e83-b_3_460/_p
부
@ARTICLE{e83-b_3_460,
author={Satoshi KAZAMA, Shinichi SHINOHARA, Risaburo SATO, },
journal={IEICE TRANSACTIONS on Communications},
title={Estimation of Current and Voltage Distributions by Scanning Coupling Probe},
year={2000},
volume={E83-B},
number={3},
pages={460-466},
abstract={This paper describes a method for estimating current and voltage distributions by scanning with a probe. The method takes advantage of the phenomenon that the coupling between the current and the probe varies with the direction of the probe. The current and voltage are estimated by calculating the probe vector output for each of four directions. Both the current and voltage vector distributions can thus be estimated at the same time by using a single probe. The estimated distributions in a digital IC package and a microstrip line showed that this method produces reliable results. The simple structure of the probe should make it easy to reduce its size.},
keywords={},
doi={},
ISSN={},
month={March},}
부
TY - JOUR
TI - Estimation of Current and Voltage Distributions by Scanning Coupling Probe
T2 - IEICE TRANSACTIONS on Communications
SP - 460
EP - 466
AU - Satoshi KAZAMA
AU - Shinichi SHINOHARA
AU - Risaburo SATO
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Communications
SN -
VL - E83-B
IS - 3
JA - IEICE TRANSACTIONS on Communications
Y1 - March 2000
AB - This paper describes a method for estimating current and voltage distributions by scanning with a probe. The method takes advantage of the phenomenon that the coupling between the current and the probe varies with the direction of the probe. The current and voltage are estimated by calculating the probe vector output for each of four directions. Both the current and voltage vector distributions can thus be estimated at the same time by using a single probe. The estimated distributions in a digital IC package and a microstrip line showed that this method produces reliable results. The simple structure of the probe should make it easy to reduce its size.
ER -