The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
본 문서에서는 산업 요구 사항을 준수하고 최대 3GHz까지 유효한 집적 회로(IC)의 전자기 내성 모델링을 위한 새로운 기술을 소개합니다. 외부 환경에 관계없이 주어진 기준에 따라 IC의 전도 내성을 예측할 수 있는 특정 모델링 흐름이 도입되었습니다. 이 방법은 여러 장치에서 수행된 측정을 통해 검증되었습니다.
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
부
Frederic LAFON, Francois DE DARAN, Mohamed RAMDANI, Richard PERDRIAU, M'hamed DRISSI, "Immunity Modeling of Integrated Circuits: An Industrial Case" in IEICE TRANSACTIONS on Communications,
vol. E93-B, no. 7, pp. 1723-1730, July 2010, doi: 10.1587/transcom.E93.B.1723.
Abstract: This paper introduces a new technique for electromagnetic immunity modeling of integrated circuits (ICs), compliant with industrial requirements and valid up to 3 GHz. A specific modeling flow is introduced, which makes it possible to predict the conducted immunity of an IC according to a given criterion, whatever its external environment. This methodology was validated through measurements performed on several devices.
URL: https://global.ieice.org/en_transactions/communications/10.1587/transcom.E93.B.1723/_p
부
@ARTICLE{e93-b_7_1723,
author={Frederic LAFON, Francois DE DARAN, Mohamed RAMDANI, Richard PERDRIAU, M'hamed DRISSI, },
journal={IEICE TRANSACTIONS on Communications},
title={Immunity Modeling of Integrated Circuits: An Industrial Case},
year={2010},
volume={E93-B},
number={7},
pages={1723-1730},
abstract={This paper introduces a new technique for electromagnetic immunity modeling of integrated circuits (ICs), compliant with industrial requirements and valid up to 3 GHz. A specific modeling flow is introduced, which makes it possible to predict the conducted immunity of an IC according to a given criterion, whatever its external environment. This methodology was validated through measurements performed on several devices.},
keywords={},
doi={10.1587/transcom.E93.B.1723},
ISSN={1745-1345},
month={July},}
부
TY - JOUR
TI - Immunity Modeling of Integrated Circuits: An Industrial Case
T2 - IEICE TRANSACTIONS on Communications
SP - 1723
EP - 1730
AU - Frederic LAFON
AU - Francois DE DARAN
AU - Mohamed RAMDANI
AU - Richard PERDRIAU
AU - M'hamed DRISSI
PY - 2010
DO - 10.1587/transcom.E93.B.1723
JO - IEICE TRANSACTIONS on Communications
SN - 1745-1345
VL - E93-B
IS - 7
JA - IEICE TRANSACTIONS on Communications
Y1 - July 2010
AB - This paper introduces a new technique for electromagnetic immunity modeling of integrated circuits (ICs), compliant with industrial requirements and valid up to 3 GHz. A specific modeling flow is introduced, which makes it possible to predict the conducted immunity of an IC according to a given criterion, whatever its external environment. This methodology was validated through measurements performed on several devices.
ER -