The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
최근, 전자장비의 증가와 승객의 편의를 위한 자동차 전자장비의 설치공간 축소로 인해 자동차의 와이어링 하니스 커넥터의 소형화가 요구되고 있다. 이러한 요구에 따라 프레팅 부식으로 인한 접촉 불량이 심각한 문제가 될 것으로 예상됩니다. 이 보고서에서는 주사 전자 현미경(SEM)과 투과 전자 현미경(TEM) 등을 사용하여 두 가지 주석 도금 두께의 프레팅 접점에 대한 미세 구조 관찰을 조사했습니다. 결과를 바탕으로 주석 도금 두께의 차이에 따른 프레팅 접촉의 미세조직 차이를 비교하였다.
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Tetsuya ITO, Shigeru SAWADA, Yasuhiro HATTORI, Yasushi SAITOH, Terutaka TAMAI, Kazuo IIDA, "Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness" in IEICE TRANSACTIONS on Electronics,
vol. E91-C, no. 8, pp. 1199-1205, August 2008, doi: 10.1093/ietele/e91-c.8.1199.
Abstract: In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion is expected to become a serious problem. In this report, we examined micro-structural observations of fretting contacts of two different tin plating thicknesses using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) and so on. Based on the results, we compared the microstructure difference of fretting contact caused by the difference of the tin plating thickness.
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e91-c.8.1199/_p
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@ARTICLE{e91-c_8_1199,
author={Tetsuya ITO, Shigeru SAWADA, Yasuhiro HATTORI, Yasushi SAITOH, Terutaka TAMAI, Kazuo IIDA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness},
year={2008},
volume={E91-C},
number={8},
pages={1199-1205},
abstract={In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion is expected to become a serious problem. In this report, we examined micro-structural observations of fretting contacts of two different tin plating thicknesses using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) and so on. Based on the results, we compared the microstructure difference of fretting contact caused by the difference of the tin plating thickness.},
keywords={},
doi={10.1093/ietele/e91-c.8.1199},
ISSN={1745-1353},
month={August},}
부
TY - JOUR
TI - Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness
T2 - IEICE TRANSACTIONS on Electronics
SP - 1199
EP - 1205
AU - Tetsuya ITO
AU - Shigeru SAWADA
AU - Yasuhiro HATTORI
AU - Yasushi SAITOH
AU - Terutaka TAMAI
AU - Kazuo IIDA
PY - 2008
DO - 10.1093/ietele/e91-c.8.1199
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E91-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 2008
AB - In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion is expected to become a serious problem. In this report, we examined micro-structural observations of fretting contacts of two different tin plating thicknesses using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) and so on. Based on the results, we compared the microstructure difference of fretting contact caused by the difference of the tin plating thickness.
ER -