The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
임의의 매질에서 산란된 빛의 평균 강도 피크 프로파일은 샘플의 두께뿐만 아니라 매질을 구성하는 입자의 부피 분율 및 크기와 같은 매개변수에 따라 달라집니다. 우리는 이 의존성을 사용하여 무작위 매체에서 변화하는 깊이 프로파일을 측정했습니다. 우리는 수송 평균 자유 경로와 티타늄 입자의 수성 현탁액 깊이를 동시에 측정할 수 있음을 보여주었습니다.
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Yasuyuki OKAMURA, Sadahiko YAMAMOTO, "Measurement of a Depth Profile in a Random Medium Using Coherent Backscattering of Light" in IEICE TRANSACTIONS on Electronics,
vol. E83-C, no. 12, pp. 1809-1813, December 2000, doi: .
Abstract: An averaged intensity peak profile of light scattered from a random medium depends on a thickness of a sample as well as parameters such as a volume fraction and a size of particles composing the medium. We used this dependence to measure a depth profile varied in the random medium. We demonstrated the possible simultaneous measurement of a transport mean free path and a depth of an aqueous suspension of titanium particles.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e83-c_12_1809/_p
부
@ARTICLE{e83-c_12_1809,
author={Yasuyuki OKAMURA, Sadahiko YAMAMOTO, },
journal={IEICE TRANSACTIONS on Electronics},
title={Measurement of a Depth Profile in a Random Medium Using Coherent Backscattering of Light},
year={2000},
volume={E83-C},
number={12},
pages={1809-1813},
abstract={An averaged intensity peak profile of light scattered from a random medium depends on a thickness of a sample as well as parameters such as a volume fraction and a size of particles composing the medium. We used this dependence to measure a depth profile varied in the random medium. We demonstrated the possible simultaneous measurement of a transport mean free path and a depth of an aqueous suspension of titanium particles.},
keywords={},
doi={},
ISSN={},
month={December},}
부
TY - JOUR
TI - Measurement of a Depth Profile in a Random Medium Using Coherent Backscattering of Light
T2 - IEICE TRANSACTIONS on Electronics
SP - 1809
EP - 1813
AU - Yasuyuki OKAMURA
AU - Sadahiko YAMAMOTO
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E83-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 2000
AB - An averaged intensity peak profile of light scattered from a random medium depends on a thickness of a sample as well as parameters such as a volume fraction and a size of particles composing the medium. We used this dependence to measure a depth profile varied in the random medium. We demonstrated the possible simultaneous measurement of a transport mean free path and a depth of an aqueous suspension of titanium particles.
ER -