The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Co-ferrite 박막은 킬레이팅 졸-겔 공정을 통해 코닝 유리 기판 위에 제조되었습니다. 필름의 구조적 및 자기적 특성은 X선 회절(XRD)과 진동 샘플 자력계를 사용하여 어닐링 온도의 함수로 연구되었습니다. XRD 결과는 대부분의 Co-ferrite 결정립이 무작위 방향으로 배열되어 있음을 보여주었습니다. 열처리의 변화와 특성비교를 위해 RA(Rapid Annealing) 공정과 SA(Standard Annealing) 공정을 사용하였다. 보자력은 열조건에 따라 변화하였고, 침지 시간에 따라 자화도 증가하였다. 그러나 침지 시간이 길어질수록 유리 기판에서 양이온이 확산되어 보자력이 감소합니다. Co-ferrite 박막 제조 시 RA는 계면에서의 상호확산을 방지하고, Soaking 시간 단축 시 단상 형성에 효과적이었다. Co-페라이트 층과 기판 사이의 이트리아 안정화 지르코니아(YSZ) 버퍼 층은 더 높은 온도에서 필름의 자기 특성을 향상시키는 데 효과적이었습니다. Co-ferrite 박막은 일반적으로 35 nm 크기의 입자로 구성되어 있으며 rms 거칠기는 약 1.3 nm인 것으로 관찰되었습니다. 900°C에서 급속 어닐링을 실시하여 박막의 포화 자화
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Hyuk LIM, Young-Jei OH, Se-Young CHOI, "Preparation and Characterization of Nanoparticulate CoFe2O4 Thin Films by the Sol-Gel Method" in IEICE TRANSACTIONS on Electronics,
vol. E83-C, no. 9, pp. 1483-1488, September 2000, doi: .
Abstract: Co-ferrite thin films have been fabricated on Corning glass substrates by a chelating sol-gel process. Structural and magnetic properties of the films have been studied as a function of annealing temperature using an X-ray diffraction (XRD) and a vibrating sample magnetometer. XRD results revealed that most of the Co-ferrite grains were randomly oriented. Rapid annealing (RA) and standard annealing (SA) processes were used for the variation of heat treatment and the characteristic comparison. Coercivity was changed with the thermal condition and the magnetization increased with the soaking time. With prolonged soaking time, however, the coercivity decreased due to the diffusion of cations from the glass substrate. RA in the preparation of Co-ferrite thin films was effective for preventing interdiffusion at interfaces and for forming a single phase in the case of reduced soaking time. A yttria stabilized zirconia (YSZ) buffer layer between the Co-ferrite layer and the substrate was effective for improving the magnetic properties of the films at higher temperatures. It was observed that Co-ferrite thin films were composed of grains typically 35 nm in size and their rms roughness was approximately 1.3 nm. The saturation magnetization of the thin films by subjected to rapid annealing at 900
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e83-c_9_1483/_p
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@ARTICLE{e83-c_9_1483,
author={Hyuk LIM, Young-Jei OH, Se-Young CHOI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Preparation and Characterization of Nanoparticulate CoFe2O4 Thin Films by the Sol-Gel Method},
year={2000},
volume={E83-C},
number={9},
pages={1483-1488},
abstract={Co-ferrite thin films have been fabricated on Corning glass substrates by a chelating sol-gel process. Structural and magnetic properties of the films have been studied as a function of annealing temperature using an X-ray diffraction (XRD) and a vibrating sample magnetometer. XRD results revealed that most of the Co-ferrite grains were randomly oriented. Rapid annealing (RA) and standard annealing (SA) processes were used for the variation of heat treatment and the characteristic comparison. Coercivity was changed with the thermal condition and the magnetization increased with the soaking time. With prolonged soaking time, however, the coercivity decreased due to the diffusion of cations from the glass substrate. RA in the preparation of Co-ferrite thin films was effective for preventing interdiffusion at interfaces and for forming a single phase in the case of reduced soaking time. A yttria stabilized zirconia (YSZ) buffer layer between the Co-ferrite layer and the substrate was effective for improving the magnetic properties of the films at higher temperatures. It was observed that Co-ferrite thin films were composed of grains typically 35 nm in size and their rms roughness was approximately 1.3 nm. The saturation magnetization of the thin films by subjected to rapid annealing at 900
keywords={},
doi={},
ISSN={},
month={September},}
부
TY - JOUR
TI - Preparation and Characterization of Nanoparticulate CoFe2O4 Thin Films by the Sol-Gel Method
T2 - IEICE TRANSACTIONS on Electronics
SP - 1483
EP - 1488
AU - Hyuk LIM
AU - Young-Jei OH
AU - Se-Young CHOI
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E83-C
IS - 9
JA - IEICE TRANSACTIONS on Electronics
Y1 - September 2000
AB - Co-ferrite thin films have been fabricated on Corning glass substrates by a chelating sol-gel process. Structural and magnetic properties of the films have been studied as a function of annealing temperature using an X-ray diffraction (XRD) and a vibrating sample magnetometer. XRD results revealed that most of the Co-ferrite grains were randomly oriented. Rapid annealing (RA) and standard annealing (SA) processes were used for the variation of heat treatment and the characteristic comparison. Coercivity was changed with the thermal condition and the magnetization increased with the soaking time. With prolonged soaking time, however, the coercivity decreased due to the diffusion of cations from the glass substrate. RA in the preparation of Co-ferrite thin films was effective for preventing interdiffusion at interfaces and for forming a single phase in the case of reduced soaking time. A yttria stabilized zirconia (YSZ) buffer layer between the Co-ferrite layer and the substrate was effective for improving the magnetic properties of the films at higher temperatures. It was observed that Co-ferrite thin films were composed of grains typically 35 nm in size and their rms roughness was approximately 1.3 nm. The saturation magnetization of the thin films by subjected to rapid annealing at 900
ER -