The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
이 편지에서는 아날로그 회로의 결함 진단을 위한 작동 상호 컨덕턴스 증폭기 및 접지 커패시터(OTA-C)를 기반으로 하는 새로운 내장 자체 테스트(BIST) 구조를 제안합니다. 제안된 아날로그 BIST 구조, 즉 ABIST는 테스트 포인트 수를 늘리고 전압 데이터로 모든 테스트 포인트를 샘플링 및 제어하며 테스트 신호 관찰 시간을 줄이는 데 사용할 수 있습니다. 제안된 ABIST 구조가 효과적인지 검증하기 위해 실험적인 측정이 이루어졌습니다.
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부
Cheng-Chung HSU, Wu-Shiung FENG, "OTA-C Based BIST Structure for Analog Circuits" in IEICE TRANSACTIONS on Fundamentals,
vol. E83-A, no. 4, pp. 771-773, April 2000, doi: .
Abstract: In this letter, a novel built-in self-test (BIST) structure based on operational transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST structure, namely ABIST, can be used to increase the number of test points, sampling and controlling of all test points with voltage data, and making less time for test signal observable. Experimental measurements have been made to verify that the proposed ABIST structure is effective.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e83-a_4_771/_p
부
@ARTICLE{e83-a_4_771,
author={Cheng-Chung HSU, Wu-Shiung FENG, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={OTA-C Based BIST Structure for Analog Circuits},
year={2000},
volume={E83-A},
number={4},
pages={771-773},
abstract={In this letter, a novel built-in self-test (BIST) structure based on operational transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST structure, namely ABIST, can be used to increase the number of test points, sampling and controlling of all test points with voltage data, and making less time for test signal observable. Experimental measurements have been made to verify that the proposed ABIST structure is effective.},
keywords={},
doi={},
ISSN={},
month={April},}
부
TY - JOUR
TI - OTA-C Based BIST Structure for Analog Circuits
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 771
EP - 773
AU - Cheng-Chung HSU
AU - Wu-Shiung FENG
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E83-A
IS - 4
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - April 2000
AB - In this letter, a novel built-in self-test (BIST) structure based on operational transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST structure, namely ABIST, can be used to increase the number of test points, sampling and controlling of all test points with voltage data, and making less time for test signal observable. Experimental measurements have been made to verify that the proposed ABIST structure is effective.
ER -