The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
본 논문에서는 회로 결함 진단을 위한 기술을 개발하고, 회로 결함 진단을 위한 테스트 패턴 척도의 공식화를 제안하는 것을 목표로 한다. 회로에 결함이 있는 경우 결함 진단은 회로에서 발생한 결함의 위치를 추론하는 것입니다. 결함 진단은 엔지니어가 물리적 결함을 검사하는 결함 분석 이전에 소프트웨어에서 실행되며 결함이 있는 회로를 생성한 제조 프로세스를 개선하는 데 도움이 됩니다. 고장 진단의 핵심은 CUD(Circuit-Under-Diagnosis)에 적용되는 테스트 패턴을 이용하여 후보 고장을 판별하는 것이므로 최대한 많은 고장을 판별할 수 있는 테스트 패턴이 생성되어야 합니다. 이 사실은 우리가 테스트 패턴에 의해 구별되는 결함 쌍의 수를 기반으로 테스트 패턴 측정을 고려하도록 동기를 부여합니다. 저자가 아는 한, 해당 측정에는 복잡도 순서의 계산 시간이 필요합니다. O(NF2), 어디서 NF 후보 결함 수를 나타냅니다. 부터 NF 실제 산업용 회로에서는 일반적으로 크기가 크므로 고성능 컴퓨터를 사용하더라도 측정 계산 시간이 길다. 본 논문에서 제안된 공식은 다음의 계산 복잡도 측정값을 계산하는 것을 가능하게 합니다. O(NF 기록 NF), 따라서 해당 조치는 결함 진단에서 테스트 패턴 선택에 유용합니다. 계산 실험에서 공식화의 효율성은 기존 공식과 제안된 공식에 의해 계산된 측정값의 계산 시간 샘플과 측정값을 기반으로 하는 여러 탐욕적 휴리스틱 간의 철저한 비교를 통해 입증됩니다.
Tsutomu INAMOTO
Ehime University
Yoshinobu HIGAMI
Ehime University
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부
Tsutomu INAMOTO, Yoshinobu HIGAMI, "Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis" in IEICE TRANSACTIONS on Fundamentals,
vol. E103-A, no. 12, pp. 1456-1463, December 2020, doi: 10.1587/transfun.2020VLP0007.
Abstract: In this paper, we aim to develop technologies for the circuit fault diagnosis and propose a formulation of a measure of a test pattern for the circuit fault diagnosis. Given a faulty circuit, the fault diagnosis is to deduce locations of faults that had occurred in the circuit. The fault diagnosis is executed in software before the failure analysis by which engineers inspect physical defects, and helps to improve the manufacturing process which yielded faulty circuits. The heart of the fault diagnosis is to distinguish between candidate faults by using test patterns, which are applied to the circuit-under-diagnosis (CUD), and thus test patterns that can distinguish as many faults as possible need to be generated. This fact motivates us to consider the test pattern measure based on the number of fault-pairs that become distinguished by a test pattern. To the best of the authors' knowledge, that measure requires the computational time of complexity order O(NF2), where NF denotes the number of candidate faults. Since NF is generally large for real industrial circuits, the computational time of the measure is long even when a high-performance computer is used. The formulation proposed in this paper makes it possible to calculate the measure in the computational complexity of O(NF log NF), and thus that measure is useful for the test pattern selection in the fault diagnosis. In computational experiments, the effectiveness of the formulation is demonstrated as samples of computational times of the measure calculated by the traditional and the proposed formulae and thorough comparisons between several greedy heuristics which are based on the measure.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.2020VLP0007/_p
부
@ARTICLE{e103-a_12_1456,
author={Tsutomu INAMOTO, Yoshinobu HIGAMI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis},
year={2020},
volume={E103-A},
number={12},
pages={1456-1463},
abstract={In this paper, we aim to develop technologies for the circuit fault diagnosis and propose a formulation of a measure of a test pattern for the circuit fault diagnosis. Given a faulty circuit, the fault diagnosis is to deduce locations of faults that had occurred in the circuit. The fault diagnosis is executed in software before the failure analysis by which engineers inspect physical defects, and helps to improve the manufacturing process which yielded faulty circuits. The heart of the fault diagnosis is to distinguish between candidate faults by using test patterns, which are applied to the circuit-under-diagnosis (CUD), and thus test patterns that can distinguish as many faults as possible need to be generated. This fact motivates us to consider the test pattern measure based on the number of fault-pairs that become distinguished by a test pattern. To the best of the authors' knowledge, that measure requires the computational time of complexity order O(NF2), where NF denotes the number of candidate faults. Since NF is generally large for real industrial circuits, the computational time of the measure is long even when a high-performance computer is used. The formulation proposed in this paper makes it possible to calculate the measure in the computational complexity of O(NF log NF), and thus that measure is useful for the test pattern selection in the fault diagnosis. In computational experiments, the effectiveness of the formulation is demonstrated as samples of computational times of the measure calculated by the traditional and the proposed formulae and thorough comparisons between several greedy heuristics which are based on the measure.},
keywords={},
doi={10.1587/transfun.2020VLP0007},
ISSN={1745-1337},
month={December},}
부
TY - JOUR
TI - Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1456
EP - 1463
AU - Tsutomu INAMOTO
AU - Yoshinobu HIGAMI
PY - 2020
DO - 10.1587/transfun.2020VLP0007
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E103-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2020
AB - In this paper, we aim to develop technologies for the circuit fault diagnosis and propose a formulation of a measure of a test pattern for the circuit fault diagnosis. Given a faulty circuit, the fault diagnosis is to deduce locations of faults that had occurred in the circuit. The fault diagnosis is executed in software before the failure analysis by which engineers inspect physical defects, and helps to improve the manufacturing process which yielded faulty circuits. The heart of the fault diagnosis is to distinguish between candidate faults by using test patterns, which are applied to the circuit-under-diagnosis (CUD), and thus test patterns that can distinguish as many faults as possible need to be generated. This fact motivates us to consider the test pattern measure based on the number of fault-pairs that become distinguished by a test pattern. To the best of the authors' knowledge, that measure requires the computational time of complexity order O(NF2), where NF denotes the number of candidate faults. Since NF is generally large for real industrial circuits, the computational time of the measure is long even when a high-performance computer is used. The formulation proposed in this paper makes it possible to calculate the measure in the computational complexity of O(NF log NF), and thus that measure is useful for the test pattern selection in the fault diagnosis. In computational experiments, the effectiveness of the formulation is demonstrated as samples of computational times of the measure calculated by the traditional and the proposed formulae and thorough comparisons between several greedy heuristics which are based on the measure.
ER -