The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
FT-AS(내결함성 집계 서명) 체계는 집계 서명이 유효하지 않은 경우 잘못된 서명을 생성하는 서명자를 추적하는 추가 기능을 갖춘 집계 서명 체계의 변형입니다. 지금까지 여러 가지 FT-AS 방식이 제안되었으며 그 중 일부는 다중 라운드, 즉 서명자가 개별 서명을 반복적으로 보내는 설정에서 이러한 불량 서명자를 추적합니다. 그러나 다중 라운드 FT-AS 방식에서는 대역폭 소비 효율성에 대한 잠재적 공격이 존재한다는 사실이 간과되어 왔습니다. 집합 서명 방식의 장점 중 하나는 대역폭 소비의 효율성이므로 이러한 공격은 다중 라운드 FT-AS 방식에 매우 중요할 수 있습니다. 본 논문에서는 이러한 공격을 견딜 수 있는 새로운 다중 라운드 FT-AS 방식을 제안합니다. 우리는 우리의 체계를 구현하고 불량 서명자가 낮은 확률로 잘못된 서명을 무작위로 생성하는 경우(예: IoT 시스템에서 장치의 자발적인 오류를 포착하는 경우) 기존 다중 라운드 FT-AS 체계보다 더 효율적이라는 것을 실험적으로 보여줍니다.
Kyosuke YAMASHITA
Osaka University,National Institute of Advanced Industrial Science and Technology (AIST)
Ryu ISHII
National Institute of Advanced Industrial Science and Technology (AIST),University of Tokyo
Yusuke SAKAI
National Institute of Advanced Industrial Science and Technology (AIST)
Tadanori TERUYA
National Institute of Advanced Industrial Science and Technology (AIST)
Takahiro MATSUDA
National Institute of Advanced Industrial Science and Technology (AIST)
Goichiro HANAOKA
National Institute of Advanced Industrial Science and Technology (AIST)
Kanta MATSUURA
University of Tokyo
Tsutomu MATSUMOTO
National Institute of Advanced Industrial Science and Technology (AIST),Yokohama National University
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부
Kyosuke YAMASHITA, Ryu ISHII, Yusuke SAKAI, Tadanori TERUYA, Takahiro MATSUDA, Goichiro HANAOKA, Kanta MATSUURA, Tsutomu MATSUMOTO, "Fault-Tolerant Aggregate Signature Schemes against Bandwidth Consumption Attack" in IEICE TRANSACTIONS on Fundamentals,
vol. E106-A, no. 9, pp. 1177-1188, September 2023, doi: 10.1587/transfun.2022DMP0005.
Abstract: A fault-tolerant aggregate signature (FT-AS) scheme is a variant of an aggregate signature scheme with the additional functionality to trace signers that create invalid signatures in case an aggregate signature is invalid. Several FT-AS schemes have been proposed so far, and some of them trace such rogue signers in multi-rounds, i.e., the setting where the signers repeatedly send their individual signatures. However, it has been overlooked that there exists a potential attack on the efficiency of bandwidth consumption in a multi-round FT-AS scheme. Since one of the merits of aggregate signature schemes is the efficiency of bandwidth consumption, such an attack might be critical for multi-round FT-AS schemes. In this paper, we propose a new multi-round FT-AS scheme that is tolerant of such an attack. We implement our scheme and experimentally show that it is more efficient than the existing multi-round FT-AS scheme if rogue signers randomly create invalid signatures with low probability, which for example captures spontaneous failures of devices in IoT systems.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.2022DMP0005/_p
부
@ARTICLE{e106-a_9_1177,
author={Kyosuke YAMASHITA, Ryu ISHII, Yusuke SAKAI, Tadanori TERUYA, Takahiro MATSUDA, Goichiro HANAOKA, Kanta MATSUURA, Tsutomu MATSUMOTO, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Fault-Tolerant Aggregate Signature Schemes against Bandwidth Consumption Attack},
year={2023},
volume={E106-A},
number={9},
pages={1177-1188},
abstract={A fault-tolerant aggregate signature (FT-AS) scheme is a variant of an aggregate signature scheme with the additional functionality to trace signers that create invalid signatures in case an aggregate signature is invalid. Several FT-AS schemes have been proposed so far, and some of them trace such rogue signers in multi-rounds, i.e., the setting where the signers repeatedly send their individual signatures. However, it has been overlooked that there exists a potential attack on the efficiency of bandwidth consumption in a multi-round FT-AS scheme. Since one of the merits of aggregate signature schemes is the efficiency of bandwidth consumption, such an attack might be critical for multi-round FT-AS schemes. In this paper, we propose a new multi-round FT-AS scheme that is tolerant of such an attack. We implement our scheme and experimentally show that it is more efficient than the existing multi-round FT-AS scheme if rogue signers randomly create invalid signatures with low probability, which for example captures spontaneous failures of devices in IoT systems.},
keywords={},
doi={10.1587/transfun.2022DMP0005},
ISSN={1745-1337},
month={September},}
부
TY - JOUR
TI - Fault-Tolerant Aggregate Signature Schemes against Bandwidth Consumption Attack
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1177
EP - 1188
AU - Kyosuke YAMASHITA
AU - Ryu ISHII
AU - Yusuke SAKAI
AU - Tadanori TERUYA
AU - Takahiro MATSUDA
AU - Goichiro HANAOKA
AU - Kanta MATSUURA
AU - Tsutomu MATSUMOTO
PY - 2023
DO - 10.1587/transfun.2022DMP0005
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E106-A
IS - 9
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - September 2023
AB - A fault-tolerant aggregate signature (FT-AS) scheme is a variant of an aggregate signature scheme with the additional functionality to trace signers that create invalid signatures in case an aggregate signature is invalid. Several FT-AS schemes have been proposed so far, and some of them trace such rogue signers in multi-rounds, i.e., the setting where the signers repeatedly send their individual signatures. However, it has been overlooked that there exists a potential attack on the efficiency of bandwidth consumption in a multi-round FT-AS scheme. Since one of the merits of aggregate signature schemes is the efficiency of bandwidth consumption, such an attack might be critical for multi-round FT-AS schemes. In this paper, we propose a new multi-round FT-AS scheme that is tolerant of such an attack. We implement our scheme and experimentally show that it is more efficient than the existing multi-round FT-AS scheme if rogue signers randomly create invalid signatures with low probability, which for example captures spontaneous failures of devices in IoT systems.
ER -