The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
본 논문에서는 MLEMTC(Maximum Likelihood Estimation for Multiple Test Chips)라고 불리는 새로운 인트라 다이 공간 상관 추출 방법을 제시한다. MLEMTC 방법에서는 모든 테스트 칩에 대한 개별 우도 함수 집합을 곱하여 결합 우도 함수를 공식화합니다. 이 결합 우도 함수는 통계 회로 분석 및 설계에 사용될 수 있는 단일 공간 상관 함수의 고유한 매개변수 값 그룹을 추출하기 위해 최대화됩니다. 또한 측정 데이터에 포함된 순전히 무작위 성분과 측정 오류를 처리하기 위해 백색 잡음의 상관 관계와 결합된 공간 상관 함수를 추출에 사용하므로 추출 결과의 정확도가 크게 향상됩니다. 또한, 우도 함수 내에서 양의 정부호 행렬의 로그 행렬식을 계산하기 위해 LU 분해 기반 기술이 개발되어 직접 계산에서 발생하는 수치적 안정성 문제를 해결합니다. 실험 결과는 제안된 방법이 효율적이고 실용적이라는 것을 보여주었다.
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부
Qiang FU, Wai-Shing LUK, Jun TAO, Xuan ZENG, Wei CAI, "Intra-Die Spatial Correlation Extraction with Maximum Likelihood Estimation Method for Multiple Test Chips" in IEICE TRANSACTIONS on Fundamentals,
vol. E92-A, no. 12, pp. 3007-3015, December 2009, doi: 10.1587/transfun.E92.A.3007.
Abstract: In this paper, a novel intra-die spatial correlation extraction method referred to as MLEMTC (Maximum Likelihood Estimation for Multiple Test Chips) is presented. In the MLEMTC method, a joint likelihood function is formulated by multiplying the set of individual likelihood functions for all test chips. This joint likelihood function is then maximized to extract a unique group of parameter values of a single spatial correlation function, which can be used for statistical circuit analysis and design. Moreover, to deal with the purely random component and measurement error contained in measurement data, the spatial correlation function combined with the correlation of white noise is used in the extraction, which significantly improves the accuracy of the extraction results. Furthermore, an LU decomposition based technique is developed to calculate the log-determinant of the positive definite matrix within the likelihood function, which solves the numerical stability problem encountered in the direct calculation. Experimental results have shown that the proposed method is efficient and practical.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E92.A.3007/_p
부
@ARTICLE{e92-a_12_3007,
author={Qiang FU, Wai-Shing LUK, Jun TAO, Xuan ZENG, Wei CAI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Intra-Die Spatial Correlation Extraction with Maximum Likelihood Estimation Method for Multiple Test Chips},
year={2009},
volume={E92-A},
number={12},
pages={3007-3015},
abstract={In this paper, a novel intra-die spatial correlation extraction method referred to as MLEMTC (Maximum Likelihood Estimation for Multiple Test Chips) is presented. In the MLEMTC method, a joint likelihood function is formulated by multiplying the set of individual likelihood functions for all test chips. This joint likelihood function is then maximized to extract a unique group of parameter values of a single spatial correlation function, which can be used for statistical circuit analysis and design. Moreover, to deal with the purely random component and measurement error contained in measurement data, the spatial correlation function combined with the correlation of white noise is used in the extraction, which significantly improves the accuracy of the extraction results. Furthermore, an LU decomposition based technique is developed to calculate the log-determinant of the positive definite matrix within the likelihood function, which solves the numerical stability problem encountered in the direct calculation. Experimental results have shown that the proposed method is efficient and practical.},
keywords={},
doi={10.1587/transfun.E92.A.3007},
ISSN={1745-1337},
month={December},}
부
TY - JOUR
TI - Intra-Die Spatial Correlation Extraction with Maximum Likelihood Estimation Method for Multiple Test Chips
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 3007
EP - 3015
AU - Qiang FU
AU - Wai-Shing LUK
AU - Jun TAO
AU - Xuan ZENG
AU - Wei CAI
PY - 2009
DO - 10.1587/transfun.E92.A.3007
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E92-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2009
AB - In this paper, a novel intra-die spatial correlation extraction method referred to as MLEMTC (Maximum Likelihood Estimation for Multiple Test Chips) is presented. In the MLEMTC method, a joint likelihood function is formulated by multiplying the set of individual likelihood functions for all test chips. This joint likelihood function is then maximized to extract a unique group of parameter values of a single spatial correlation function, which can be used for statistical circuit analysis and design. Moreover, to deal with the purely random component and measurement error contained in measurement data, the spatial correlation function combined with the correlation of white noise is used in the extraction, which significantly improves the accuracy of the extraction results. Furthermore, an LU decomposition based technique is developed to calculate the log-determinant of the positive definite matrix within the likelihood function, which solves the numerical stability problem encountered in the direct calculation. Experimental results have shown that the proposed method is efficient and practical.
ER -