The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
회로 수준의 새로운 아날로그 불일치 모델이 개발되었습니다. MOS 트랜지스터의 소신호 매개변수는 강 반전 동작과 약한 반전 동작 모두에 대한 일치 특성 측면에서 모델링됩니다. 기본 CMOS 증폭기에 대한 불일치 분석은 제안된 모델과 Monte Carlo SPICE 시뮬레이션을 통해 수행됩니다. 실제 아날로그 회로 설계를 이용하여 평균 오차 10% 이내에서 정확성이 검증된 아날로그 CMOS 회로의 성능 불일치에 대한 간단한 분석 공식을 도출하는데 성공했습니다.
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Hiroo MASUDA, Takeshi KIDA, Shin-ichi OHKAWA, "Comprehensive Matching Characterization of Analog CMOS Circuits" in IEICE TRANSACTIONS on Fundamentals,
vol. E92-A, no. 4, pp. 966-975, April 2009, doi: 10.1587/transfun.E92.A.966.
Abstract: A new analog mismatch model in circuit level has been developed. MOS transistor's small signal parameters are modeled in term of their matching character for both strong- and weak-inversion operations. Mismatch analysis on basic CMOS amplifiers are conducted with proposed model and Monte Carlo SPICE simulations. We successfully derived simple analytical formula on performance mismatch for analog CMOS circuits, which is verified to be accurate in using actual analog circuit design, within an average error of less than 10%.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E92.A.966/_p
부
@ARTICLE{e92-a_4_966,
author={Hiroo MASUDA, Takeshi KIDA, Shin-ichi OHKAWA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Comprehensive Matching Characterization of Analog CMOS Circuits},
year={2009},
volume={E92-A},
number={4},
pages={966-975},
abstract={A new analog mismatch model in circuit level has been developed. MOS transistor's small signal parameters are modeled in term of their matching character for both strong- and weak-inversion operations. Mismatch analysis on basic CMOS amplifiers are conducted with proposed model and Monte Carlo SPICE simulations. We successfully derived simple analytical formula on performance mismatch for analog CMOS circuits, which is verified to be accurate in using actual analog circuit design, within an average error of less than 10%.},
keywords={},
doi={10.1587/transfun.E92.A.966},
ISSN={1745-1337},
month={April},}
부
TY - JOUR
TI - Comprehensive Matching Characterization of Analog CMOS Circuits
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 966
EP - 975
AU - Hiroo MASUDA
AU - Takeshi KIDA
AU - Shin-ichi OHKAWA
PY - 2009
DO - 10.1587/transfun.E92.A.966
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E92-A
IS - 4
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - April 2009
AB - A new analog mismatch model in circuit level has been developed. MOS transistor's small signal parameters are modeled in term of their matching character for both strong- and weak-inversion operations. Mismatch analysis on basic CMOS amplifiers are conducted with proposed model and Monte Carlo SPICE simulations. We successfully derived simple analytical formula on performance mismatch for analog CMOS circuits, which is verified to be accurate in using actual analog circuit design, within an average error of less than 10%.
ER -