The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
나노미터 시대에는 전력 무결성 문제가 중요한 문제 중 하나가 되었습니다. 이 문제를 조기에 확인하면 해석 속도가 빨라질 수 있지만 현재는 높은 수준의 제한된 설계 정보로 인해 사용할 수 있는 도구가 많지 않습니다. 게이트 수준의 대부분의 기존 접근 방식에는 셀 라이브러리에 대한 추가 정보가 필요하므로 새로운 셀 라이브러리로 마이그레이션하는 동안 추가 특성화 노력이 필요할 수 있습니다. 따라서 본 논문에서는 순차 회로에 대해서도 기존 라이브러리 정보만을 사용하여 게이트 레벨에서 공급 전류 파형을 동적으로 추정하는 분석적 접근 방식을 제안합니다. 실험 결과에 따르면 이러한 빠른 접근 방식의 추정 오류는 HSPICE 결과에 비해 10%에 불과합니다.
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부
Mu-Shun Matt LEE, Chien-Nan Jimmy LIU, "Dynamic Supply Current Waveform Estimation with Standard Library Information" in IEICE TRANSACTIONS on Fundamentals,
vol. E93-A, no. 3, pp. 595-606, March 2010, doi: 10.1587/transfun.E93.A.595.
Abstract: In the nanometer era, the power integrity problem has become one of the critical issues. Although checking this problem earlier can speed up the analysis, not so many tools are available now due to the limited design information at high levels. Most existing approaches at gate level require extra information of the cell library, which may require extra characterization efforts while migrating to new cell libraries. Therefore, an analytical approach is proposed in this paper to dynamically estimate the supply current waveforms at gate level using existing library information only, even for sequential circuits. The experimental results have shown that the estimation errors of such a quick approach are only 10% compared to HSPICE results.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E93.A.595/_p
부
@ARTICLE{e93-a_3_595,
author={Mu-Shun Matt LEE, Chien-Nan Jimmy LIU, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Dynamic Supply Current Waveform Estimation with Standard Library Information},
year={2010},
volume={E93-A},
number={3},
pages={595-606},
abstract={In the nanometer era, the power integrity problem has become one of the critical issues. Although checking this problem earlier can speed up the analysis, not so many tools are available now due to the limited design information at high levels. Most existing approaches at gate level require extra information of the cell library, which may require extra characterization efforts while migrating to new cell libraries. Therefore, an analytical approach is proposed in this paper to dynamically estimate the supply current waveforms at gate level using existing library information only, even for sequential circuits. The experimental results have shown that the estimation errors of such a quick approach are only 10% compared to HSPICE results.},
keywords={},
doi={10.1587/transfun.E93.A.595},
ISSN={1745-1337},
month={March},}
부
TY - JOUR
TI - Dynamic Supply Current Waveform Estimation with Standard Library Information
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 595
EP - 606
AU - Mu-Shun Matt LEE
AU - Chien-Nan Jimmy LIU
PY - 2010
DO - 10.1587/transfun.E93.A.595
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E93-A
IS - 3
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - March 2010
AB - In the nanometer era, the power integrity problem has become one of the critical issues. Although checking this problem earlier can speed up the analysis, not so many tools are available now due to the limited design information at high levels. Most existing approaches at gate level require extra information of the cell library, which may require extra characterization efforts while migrating to new cell libraries. Therefore, an analytical approach is proposed in this paper to dynamically estimate the supply current waveforms at gate level using existing library information only, even for sequential circuits. The experimental results have shown that the estimation errors of such a quick approach are only 10% compared to HSPICE results.
ER -