The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
하위 처리 요소(sub-PE) 수준 중복성을 위한 최적의 할당 모델이 개발되었으며 이는 유전자 알고리즘에 의해 해결됩니다. 할당 모델에서 평균 결함 밀도 D 요소 수율을 정확하게 분석하기 위해 매개변수 δ도 고려됩니다. 여기서 δ는 PE의 전체 면적에 대한 지원 회로 면적의 비율로 정의됩니다. PE의 영역이 제약 조건에 부과되면 모델의 최적 솔루션은 서로 다릅니다. D 및 δ가 계산됩니다. 시뮬레이션 결과는 고정된 평균 결함 밀도에 대해 다음을 나타냅니다. D, PE에 추가되는 최적 중복 하위 회로의 수와 PE의 수율은 δ가 증가함에 따라 감소합니다. 또한 고정된 매개변수 δ에 대해 최적의 중복 하위 회로의 수가 증가하는 반면 PE의 최적 수율은 다음과 같이 감소합니다. D 증가합니다.
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부
Tianxu ZHAO, Yue HAO, Yong-Chang JIAO, "VLSI Yield Optimization Based on the Redundancy at the Sub-Processing-Element Level" in IEICE TRANSACTIONS on Information,
vol. E84-D, no. 11, pp. 1471-1475, November 2001, doi: .
Abstract: An optimal allocation model for the sub-processing-element (sub-PE) level redundancy is developed, which is solved by the genetic algorithms. In the allocation model, the average defect density D and the parameter δ are also considered in order to accurately analyze the element yield, where δ is defined as the ratio of the support circuit area to the total area of a PE. When the PE's area is imposed on the constraint, the optimal solutions of the model with different D and δ are calculated. The simulation results indicate that, for any fixed average defect density D, both the number of the optimal redundant sub-circuit added into a PE and the PE's yield decrease as δ increases. Moreover, for any fixed parameter δ, the number of the optimal redundant sub-circuit increases, while the optimal yield of the PE decreases, as D increases.
URL: https://global.ieice.org/en_transactions/information/10.1587/e84-d_11_1471/_p
부
@ARTICLE{e84-d_11_1471,
author={Tianxu ZHAO, Yue HAO, Yong-Chang JIAO, },
journal={IEICE TRANSACTIONS on Information},
title={VLSI Yield Optimization Based on the Redundancy at the Sub-Processing-Element Level},
year={2001},
volume={E84-D},
number={11},
pages={1471-1475},
abstract={An optimal allocation model for the sub-processing-element (sub-PE) level redundancy is developed, which is solved by the genetic algorithms. In the allocation model, the average defect density D and the parameter δ are also considered in order to accurately analyze the element yield, where δ is defined as the ratio of the support circuit area to the total area of a PE. When the PE's area is imposed on the constraint, the optimal solutions of the model with different D and δ are calculated. The simulation results indicate that, for any fixed average defect density D, both the number of the optimal redundant sub-circuit added into a PE and the PE's yield decrease as δ increases. Moreover, for any fixed parameter δ, the number of the optimal redundant sub-circuit increases, while the optimal yield of the PE decreases, as D increases.},
keywords={},
doi={},
ISSN={},
month={November},}
부
TY - JOUR
TI - VLSI Yield Optimization Based on the Redundancy at the Sub-Processing-Element Level
T2 - IEICE TRANSACTIONS on Information
SP - 1471
EP - 1475
AU - Tianxu ZHAO
AU - Yue HAO
AU - Yong-Chang JIAO
PY - 2001
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E84-D
IS - 11
JA - IEICE TRANSACTIONS on Information
Y1 - November 2001
AB - An optimal allocation model for the sub-processing-element (sub-PE) level redundancy is developed, which is solved by the genetic algorithms. In the allocation model, the average defect density D and the parameter δ are also considered in order to accurately analyze the element yield, where δ is defined as the ratio of the support circuit area to the total area of a PE. When the PE's area is imposed on the constraint, the optimal solutions of the model with different D and δ are calculated. The simulation results indicate that, for any fixed average defect density D, both the number of the optimal redundant sub-circuit added into a PE and the PE's yield decrease as δ increases. Moreover, for any fixed parameter δ, the number of the optimal redundant sub-circuit increases, while the optimal yield of the PE decreases, as D increases.
ER -