The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
본 논문에서는 소규모 테스트 데이터 저장으로 완벽한 오류 효율성을 보장하기 위해 NPG(인접 패턴 생성기)를 사용하는 새로운 결정론적 내장 테스트 방식을 제시합니다. 디코딩 논리인 NPG는 상위 패턴으로부터 작은 해밍 거리 내에서 상위 패턴과 결정적 하위 패턴을 모두 생성합니다. 테스트 큐브 세트는 NPG의 시드 세트로 인코딩됩니다. 제안된 방법은 테스트 중인 회로에 대한 영향이 필요하지 않으며 NPG 설계에 테스트 생성 결과가 필요하지 않기 때문에 실제로 수용 가능합니다. 또한 NPG를 위한 효율적인 시드 생성 방법을 설명합니다. 벤치마크 회로에 대한 실험 결과는 제안된 방법이 다른 결정론적 내장 테스트 방법과 비교할 때 저장 요구 사항을 크게 줄일 수 있음을 보여줍니다.
아르, 테스트 패턴 생성기, 다시 시드, 비트 뒤집기, 종자 생성
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Michinobu NAKAO, Yoshikazu KIYOSHIGE, Koichiro NATSUME, Kazumi HATAYAMA, Satoshi FUKUMOTO, Kazuhiko IWASAKI, "Deterministic Built-in Test with Neighborhood Pattern Generator" in IEICE TRANSACTIONS on Information,
vol. E85-D, no. 5, pp. 874-883, May 2002, doi: .
Abstract: This paper presents a new deterministic built-in test scheme using a neighborhood pattern generator (NPG) to guarantee complete fault efficiency with small test-data storage. The NPG as a decoding logic generates both a parent pattern and deterministic child patterns within a small Hamming distance from the parent pattern. A set of test cubes is encoded as a set of seeds for the NPG. The proposed method is practically acceptable because no impact on a circuit under test is required and the design of the NPG does not require the results of test generation. We also describe an efficient seed generation method for the NPG. Experimental results for benchmark circuits demonstrate that the proposed method can significantly reduce the storage requirements when compared with other deterministic built-in test methods.
URL: https://global.ieice.org/en_transactions/information/10.1587/e85-d_5_874/_p
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@ARTICLE{e85-d_5_874,
author={Michinobu NAKAO, Yoshikazu KIYOSHIGE, Koichiro NATSUME, Kazumi HATAYAMA, Satoshi FUKUMOTO, Kazuhiko IWASAKI, },
journal={IEICE TRANSACTIONS on Information},
title={Deterministic Built-in Test with Neighborhood Pattern Generator},
year={2002},
volume={E85-D},
number={5},
pages={874-883},
abstract={This paper presents a new deterministic built-in test scheme using a neighborhood pattern generator (NPG) to guarantee complete fault efficiency with small test-data storage. The NPG as a decoding logic generates both a parent pattern and deterministic child patterns within a small Hamming distance from the parent pattern. A set of test cubes is encoded as a set of seeds for the NPG. The proposed method is practically acceptable because no impact on a circuit under test is required and the design of the NPG does not require the results of test generation. We also describe an efficient seed generation method for the NPG. Experimental results for benchmark circuits demonstrate that the proposed method can significantly reduce the storage requirements when compared with other deterministic built-in test methods.},
keywords={},
doi={},
ISSN={},
month={May},}
부
TY - JOUR
TI - Deterministic Built-in Test with Neighborhood Pattern Generator
T2 - IEICE TRANSACTIONS on Information
SP - 874
EP - 883
AU - Michinobu NAKAO
AU - Yoshikazu KIYOSHIGE
AU - Koichiro NATSUME
AU - Kazumi HATAYAMA
AU - Satoshi FUKUMOTO
AU - Kazuhiko IWASAKI
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E85-D
IS - 5
JA - IEICE TRANSACTIONS on Information
Y1 - May 2002
AB - This paper presents a new deterministic built-in test scheme using a neighborhood pattern generator (NPG) to guarantee complete fault efficiency with small test-data storage. The NPG as a decoding logic generates both a parent pattern and deterministic child patterns within a small Hamming distance from the parent pattern. A set of test cubes is encoded as a set of seeds for the NPG. The proposed method is practically acceptable because no impact on a circuit under test is required and the design of the NPG does not require the results of test generation. We also describe an efficient seed generation method for the NPG. Experimental results for benchmark circuits demonstrate that the proposed method can significantly reduce the storage requirements when compared with other deterministic built-in test methods.
ER -