The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
이 문서에서는 대부분의 테스트(MISR 지원 테스트 모드)에 대해 MISR을 사용하여 최종 출력 압축을 달성하는 동시에 소규모 테스트 세트(MISR 우회 테스트 모드)에서 MISR을 우회하여 직접 진단을 가능하게 하는 간단한 방법을 설명합니다. 동일한 장치에서 구성표, XOR 및 MISR을 사용하면 높은 압축률을 유지하면서도 압축 모드 볼륨 진단을 지원할 수 있습니다. 우리의 실험에서는 MISR-bypass 테스트를 먼저 실행하고 전체 테스트 세트의 10%에서 MISR 활성화 테스트를 수행했습니다. 결과는 MISR+XOR 기반 압축과 비교하여 제안된 기술이 약간 작은(0.71 X ~ 0.97 X) 압축 비율로 더 나은 볼륨 진단을 제공한다는 것을 보여줍니다. 스캔 주기는 MISR 활성화 모드와 거의 동일합니다. 부분적으로 양호한 칩에 적용할 수 있는 가능성도 나와 있습니다.
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Anis UZZAMAN, Brion KELLER, Brian FOUTZ, Sandeep BHATIA, Thomas BARTENSTEIN, Masayuki ARAI, Kazuhiko IWASAKI, "Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression" in IEICE TRANSACTIONS on Information,
vol. E93-D, no. 1, pp. 17-23, January 2010, doi: 10.1587/transinf.E93.D.17.
Abstract: This paper describes a simple means to enable direct diagnosis by bypassing MISRs on a small set of tests (MISR-bypass test mode) while achieving ultimate output compression using MISRs for the majority of tests (MISR-enabled test mode.) By combining two compression schemes, XOR and MISRs in the same device, it becomes possible to have high compression and still support compression mode volume diagnostics. In our experiment, the MISR-bypass test was first executed and at 10% of the total test set the MISR-enabled test was performed. The results show that compared with MISR+XOR-based compression the proposed technique provides better volume diagnosis with slightly small (0.71 X to 0.97 X) compaction ratio. The scan cycles are about the same as the MISR-enabled mode. A possible application to partial good chips is also shown.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E93.D.17/_p
부
@ARTICLE{e93-d_1_17,
author={Anis UZZAMAN, Brion KELLER, Brian FOUTZ, Sandeep BHATIA, Thomas BARTENSTEIN, Masayuki ARAI, Kazuhiko IWASAKI, },
journal={IEICE TRANSACTIONS on Information},
title={Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression},
year={2010},
volume={E93-D},
number={1},
pages={17-23},
abstract={This paper describes a simple means to enable direct diagnosis by bypassing MISRs on a small set of tests (MISR-bypass test mode) while achieving ultimate output compression using MISRs for the majority of tests (MISR-enabled test mode.) By combining two compression schemes, XOR and MISRs in the same device, it becomes possible to have high compression and still support compression mode volume diagnostics. In our experiment, the MISR-bypass test was first executed and at 10% of the total test set the MISR-enabled test was performed. The results show that compared with MISR+XOR-based compression the proposed technique provides better volume diagnosis with slightly small (0.71 X to 0.97 X) compaction ratio. The scan cycles are about the same as the MISR-enabled mode. A possible application to partial good chips is also shown.},
keywords={},
doi={10.1587/transinf.E93.D.17},
ISSN={1745-1361},
month={January},}
부
TY - JOUR
TI - Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression
T2 - IEICE TRANSACTIONS on Information
SP - 17
EP - 23
AU - Anis UZZAMAN
AU - Brion KELLER
AU - Brian FOUTZ
AU - Sandeep BHATIA
AU - Thomas BARTENSTEIN
AU - Masayuki ARAI
AU - Kazuhiko IWASAKI
PY - 2010
DO - 10.1587/transinf.E93.D.17
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E93-D
IS - 1
JA - IEICE TRANSACTIONS on Information
Y1 - January 2010
AB - This paper describes a simple means to enable direct diagnosis by bypassing MISRs on a small set of tests (MISR-bypass test mode) while achieving ultimate output compression using MISRs for the majority of tests (MISR-enabled test mode.) By combining two compression schemes, XOR and MISRs in the same device, it becomes possible to have high compression and still support compression mode volume diagnostics. In our experiment, the MISR-bypass test was first executed and at 10% of the total test set the MISR-enabled test was performed. The results show that compared with MISR+XOR-based compression the proposed technique provides better volume diagnosis with slightly small (0.71 X to 0.97 X) compaction ratio. The scan cycles are about the same as the MISR-enabled mode. A possible application to partial good chips is also shown.
ER -